钙铝硅系微晶玻璃残余应力的初探  

Analyse on Residual Stresses in CaO-Al_2O_3-SiO_2 System Glass-ceramics

作　　者：谢俊[1] 刘凤娟[1] 程金树[1] 何峰[1] 杨淑珍[2] 

机构地区：[1]武汉理工大学硅酸盐材料工程教育部重点实验室,武汉430070 [2]武汉理工大学测试中心,武汉430070

出　　处：《武汉理工大学学报》2004年第10期5-7,共3页Journal of Wuhan University of Technology

基　　金：国家自然科学基金 (5 0 2 72 0 4 3);湖北省自然科学基金 (2 0 0 2 AB0 77);武汉理工大学硅酸盐材料教育部重点实验室基金 (SYSJJ2 0 0 2 - 0 8)

摘　　要：介绍了 X射线衍射法测试应力的原理 ,并用 X射线衍射法测定了 Ca O- Al2 O3- Si O2 系微晶玻璃的残余应力 ,结合应力测试结果探讨了 Ca O- Al2 O3- Si O2 系微晶玻璃残余应力的形成原理。 X射线衍射法测试残余应力结果表明 ,试样表面的残余应力为压应力 ,并且当试样表面经过机械磨抛后 。X-ray diffraction method to determine the residual stress was studied in this paper. Firstly, the use of X-ray diffraction method, the residual stress in CaO-Al_2O_3-SiO_2 system glass-ceramics had been measured. Secondly, it analysed the formation mechanism and characterization of residual stresses in CaO-Al_2O_3-SiO_2 system glass-ceramics. Lastly, the measured and calculated results indicated that the average residual stresses in glass-ceramic were compressed and after grinding the face of the sample, the average residual stresses decreased.

关 键 词：微晶玻璃 残余应力 X射线衍射法 

分 类 号：TQ171.73[化学工程—玻璃工业]