SiC_w/Al复合材料高温再结晶行为的X射线衍射分析  

X-RAY DIFFRACTION ANALYSIS FOR THE RECRYSTAL- LIZATION BEHAVIOR OF SiCw/Al COMPOSITE AT HIGH TEMPERATURE

作　　者：姜传海[1] 吴建生[1] 王德尊[2] 

机构地区：[1]上海交通大学材料科学与工程学院高温材料及高温测试教育部重点实验室,上海200030 [2]哈尔滨工业大学材料科学与工程学院,哈尔滨150001

出　　处：《金属学报》2004年第10期1023-1026,共4页Acta Metallurgica Sinica

摘　　要：利用原位X射线衍射及线形分析方法,测量加热过程中冷轧SiCw/Al复合材料基体晶块尺寸及显微畸变的变化规 律,探讨复合材料再结晶行为.结果表明,复合材料基体晶粒长大及高温回复激活能均与纯Al自扩散激活能接近,证实了再结晶 后晶粒长大伴随着高温回复现象,并且晶须对复合材料基体晶粒长大及高温回复的影响不明显.By using in situ X-ray diffraction and profile analysis, the variations of subgrain size and microstrain in the cold-rolled SiCw/Al composite at high temperature were measured, and the recrystallization behavior of composite was investigated. Test results show that both of the activation energies of recrystallized grain growth and matrix recovery at higher temperature are close to the activation energy for self-diffusion of pure Al, which verifies that the recovery phenomenon was accompanied with the grain growth, and the whiskers can not affect the grain growth and recovery of matrix in composite at higher temperature.

关 键 词：SICW/AL复合材料 再结晶 X射线衍射 

分 类 号：TG115[金属学及工艺—物理冶金]