运用碳纳米管原子力显微镜针尖减小长程力作用的研究  

REDUCTION OF LONG-RANGE FORCE INTERACTION USING AFM CARBON NANOTUBE TIP

作　　者：国立秋[1] 梁吉[1] 董申[2] 赵清亮[2] 

机构地区：[1]清华大学机械工程系,北京100084 [2]哈尔滨工业大学精密工程研究所,哈尔滨150001

出　　处：《机械工程学报》2004年第10期15-18,共4页Journal of Mechanical Engineering

基　　金：国家自然科学基金资助项目(50205006)

摘　　要：减小探针和样品表面之间的长程宏观力是原子力显微镜获得高分辨率成像的关键。首先通过理论分析得出影响长程力的主要因素是探针的几何形状和尺寸。然后分别运用几何形状和尺寸不同的原子力显微镜的传统Si针尖和碳纳米管针尖对样品进行扫描试验研究,结果显示碳纳米管针尖较传统针尖获得了高分辨率的图像。这一结果表明,碳纳米管针尖减小了成像中宏观长程作用力的影响,是理想的原子力显微镜针尖。High-resolution imaging of the AFM is based on the minimization of the long-range forces between the microscopic tip and the surface. Theoretical analysis shows that the shape and size of tips are main agents influencing long-range force. Si tips and carbon nanotube tips with different shapes and sizes are used to scan the sample surface. Higher resolution images are obtained with carbon nanotube tips than those with Si tips. This result suggests that carbon nanotube tip is ideal in AFM imaging since it could reduce macroscopical long-range force.

关 键 词：原子力显微镜 碳纳米管 针尖 长程力 

分 类 号：TH14[一般工业技术—材料科学与工程]