Ag/TCNQ纳米双层膜中传质规律研究  

Studies on the transport behavior of Ag/TCNQ thin films

作　　者：谢亨博[1] 蒋益明[1] 郭峰[1] 刘平[1] 李劲[1] 

机构地区：[1]复旦大学材料科学系,上海200433

出　　处：《物理学报》2004年第11期3849-3852,共4页Acta Physica Sinica

基　　金：国家自然科学基金 (批准号 :10 3 740 15 );国家重点基础研究发展规划项目 (批准号 :2 0 0 2CB613 5 0 4);上海市科学技术委员会专项基金 (批准号 :0 2 5 9nm0 89)资助的课题~~

摘　　要：采用真空蒸发的方法在玻璃基板上交替蒸发Ag和TCNQ ,形成不同厚度的双层膜 .利用透射光谱作为表征 ,研究了双层膜中的传质规律 .发现超薄膜情况时的异常加速传质现象 。Ag/TCNQ bi-layer films with different thickness were prepared on glass substrates by alternating vacuum deposition of Ag and TCNQ. The transport behavior in the film was studied using transmission spectrum to monitor the process. An abnormal accelerated transport phenomenon was observed when the film was ultra thin and a tunneling model was proposed to explain this phenomenon.

关 键 词：双层膜 TCNQ 超薄膜 透射光谱 表征 隧穿 真空蒸发 玻璃基板 厚度 纳米 

分 类 号：O484.4[理学—固体物理]