纳米粒子粒径评估及测试方法的比较  

COMPARISON OF METHODS ON EVALUATION AND MEASUREMENT OF NANO-PARTICLES SIZE

作　　者：朱静[1] 蔺锡伟 郭薇[2] 贾丽萍[2] 赵向荣[2] 张晋远[2] 柳春兰[2] 叶恒强[3] 宁小光[3] 

机构地区：[1]洽金工业部钢铁研究总院十三室,教授北京100081 [2]冶金工业部钢铁研究总院 [3]中国科学院金属研究所

出　　处：《金属学报》1993年第1期B001-B010,共10页Acta Metallurgica Sinica

摘　　要：本文介绍了透射电镜综合分析—分散法测定纳米粒子粒径的方法,并将此法与X射线小角散射法及透射电镜暗场法测粒径进行了实验与分析的比较。认为采用X射线小角散射法与透射电镜综合分析—分散法相结合测定评估纳米粒子粒径可以以较快的速度得到准确的结果、综合的信息。Method of TEM compositive anlysis-dispersion for measuring nano-particle size is reviewed. Comparison of methods between this and of X-ray small angle scattering as well as of TEM in dark field was carried out by experiments and anlyses. It is believed that combination of X-ray small angle scattering and TEM compositive analysis-dispersion method is the more rapid, accurate and comprehensive way to evaluate and measure the nano-particle size.

关 键 词：纳米粒子 粒度评估 测试方法 

分 类 号：TF122.1[冶金工程—粉末冶金]