基于等离子体激光的X射线弯晶谱仪研究  

Research of X-ray curved crystals spectrometer based on laser-plasma

作　　者：肖沙里[1] 周宴[1] 熊先才[1] 钟先信[1] 杨国洪[2] 

机构地区：[1]重庆大学光电技术及系统教育部重点实验室,重庆400044 [2]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《光学仪器》2004年第5期35-39,共5页Optical Instruments

基　　金：国家863-804课题资助项目(803-804-3)。

摘　　要：X射线光谱议是一种强有力的激光等离子体诊断工具。为了获取激光等离子体发射的X射线中所包含大量信息,基于椭圆几何原理设计制造了X射线弯晶谱议。在上海神光 号装置上利用LiF弯曲晶体分析器,用150J激光能量对Ti靶进行了试验。通过X射线CCD记录获取的谱线,结果表明这种聚焦型晶体分析器的灵敏度有了明显的提高。Because X-ray spectrograph is a powerful tool to plasma diagnosis, to study the information and evolution of the plasma, in order to investigate the properties of laser produced plasmas, X-ray elliptical curved crystal spectrograph was designed and manufactured. The experiment was carried out on Shanghai Shenguang-Ⅱ Facility. Experimental results using LiF Curved crystal analyzer are described which show spectrum of Ti laser-plasma. Spectra showing the main resonance line were recorded with X-ray CCD and with laser energies 150J. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal.

关 键 词：弯晶谱仪 晶体 激光等离子体 X射线 椭圆 谱线 聚焦 分析器 激光能量 CCD 

分 类 号：TH744.15[机械工程—光学工程] O721[机械工程—仪器科学与技术]