分光光度法测定金属硅中铁的线性校正与受控下的不确定度评估  

The linear calibration and uncertainty in determination of Fe in metallic silicon by spectrophotometry

作　　者：王斗文[1] 赵嗣奇[2] 卫锋[1] 于振凡[3] 

机构地区：[1]辽宁出入境检验检疫局,大连116001 [2]沈阳农业大学动物科学系,沈阳110161 [3]中国标准化研究院,北京100088

出　　处：《分析试验室》2004年第10期61-65,共5页Chinese Journal of Analysis Laboratory

基　　金：国家出入境检验检疫局科学基金资助项目(k9802)

摘　　要：用分光光度法测定金属硅中铁量,来分析讨论如何采用基本方法和控制方法技术,进行校正函数的残差齐性方差检验和有效期间的受控分析。研究结果表明,采用控制方法可以确保测量不确定度尽可能小,以达到检测的最终要求。This paper described how to estimate the linear calibration and uncertainty when Fe in metrallic silicon was determined by spectrephotometry. The method was to check the assumption of linearity of the calibration function and ANOVA under the model of constant residual variance. It was desirable to monitor the validity of the calibration curve when the function was used for an extended period of time. The major purpose of the technique was to maintain the least of uncertainties of the transformed values for that 'calibrated' measurement system in a state of statistical control.

关 键 词：分光光度法 金属硅 铁 含量测定 线性校正 受控分析 不确定度 残差齐性 有效期间 控制方法 基本方法 

分 类 号：O614.811[理学—无机化学] O657.3[理学—化学]