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出 处:《Journal of Materials Science & Technology》2004年第6期678-680,共3页材料科学技术(英文版)
基 金:.This work was supported by the Key National Natural Science Foundation of China(Grant No.59832060).
摘 要:TeO_x thin films were prepared by vacuum evaporation of TeO_2 powder. Structural characteristic and surface mor-phology of the as-deposited films was analyzed by using X-ray photoelectron spectroscopy, transmission electron microscopy, X-ray diffractometer and atomic force microscopy. It was found that the films represented a two component system comprising Te particies dispersed in an amorphous TeO2 matrix. The dispersed Te particies were in a crystalline state. The TeOx films showed a finely granular structure and a rough surface. Results of the statie recording test showed that the TeO_x films had good writing sensitivity for short-wavelength laser beam (514.5 nm). Primary results of the dynamic test at 514.5 nm were also reported. The TeO_x films were suitable for using as a blue-green wavelength high density optical storage medium.TeO_x thin films were prepared by vacuum evaporation of TeO_2 powder. Structural characteristic and surface mor-phology of the as-deposited films was analyzed by using X-ray photoelectron spectroscopy, transmission electron microscopy, X-ray diffractometer and atomic force microscopy. It was found that the films represented a two component system comprising Te particies dispersed in an amorphous TeO2 matrix. The dispersed Te particies were in a crystalline state. The TeOx films showed a finely granular structure and a rough surface. Results of the statie recording test showed that the TeO_x films had good writing sensitivity for short-wavelength laser beam (514.5 nm). Primary results of the dynamic test at 514.5 nm were also reported. The TeO_x films were suitable for using as a blue-green wavelength high density optical storage medium.
关 键 词:TeO_x thin film Statie recording test Dynamic test High density optical storage
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