共焦激光扫描显微系统中暗场成像新途径  

A NEW METHOD TO FORM IMAGES WITH DARK-FIELD IN CONFOCAL SCANNING LASER MICROSCOPY SYSTEM

作　　者：曹伶华 冯璧华[1] Damaskinos S Dixon A E 

机构地区：[1]南京大学物理系 [2]加拿大Waterloo大学物理系

出　　处：《南京大学学报（自然科学版）》1993年第4期592-596,共5页Journal of Nanjing University（Natural Science）

摘　　要：本文描述了作者首次依据空间频谱的分布特征,提出了在共焦激光扫描显微系统中实现暗场成像的新途径——离轴成像法.并成功地应用到了单晶砷化镓(GaAs)的红外透射成像上。与传统的明场法相比,取得的图像不仅更具细节,对比度提高,而且还明显地消除了来自其它截面的伪像。Based on the spatial spectral distribution, a new method to form images with dark—field ib proposed for applications in Confocal scanning Laser microscopy system. This method, called off—axisimaging, has been successfully applied to single crystal GaAs to Look at the infrared transmission images. Compared to the traditional method which gives images with bright—field, this new method reveals more details, enhances contrast and it is able to eliminate ghost images remarkably from other sections.

关 键 词：共焦 激光 扫描系统 暗场成像 

分 类 号：TH742.64[机械工程—光学工程]