珍珠表面微形貌的AFM和SEM研究  

An AFM and SEM study on microscopic figure of pearl surface

作　　者：张妮[1] 郭继春[1] 张学云[2] 李加贵[2] 

机构地区：[1]南京大学地球科学系,江苏南京210093 [2]江苏省质量技术监督局南京大学珠宝产品质量检验站,江苏南京210093

出　　处：《岩石矿物学杂志》2004年第4期370-374,共5页Acta Petrologica et Mineralogica

摘　　要：利用原子力显微镜 (AFM )结合传统的扫描电镜 (SEM )观察不同质量的珍珠表面 ,在微米级至纳米级的范围内对珍珠表面进行了全面的超显微结构特征分析 ,探讨SEM下无法涉及的珍珠纳米级表面结构与珍珠物理特性(光泽度、粗糙度、伴色 )之间的相关性。研究显示 ,珍珠等级与文石层、文石微层、文石板块及其内部文石集合体的有序度、致密度等均呈正相关关系。本文还提出在珍珠养殖与交易的珍珠分级中可利用微形貌数据如平均粗糙度(Ra)Using AFM and traditional SEM, the authors studied the super-microscopic structure of pearls from micron-size to nanometer-size by observing the surfaces of pearls with different qualities, and discussed the correlation between the nanometer-size surface structure invisible with SEM and the physical properties (luster, roughness and concomitant color) of pearl. The research shows that the grade of pearl has a positive correlation with ordering and compactness of layers, microlayers, blocks and aggregates of aragonite. It is also suggested that quantified standard should be added to the classification for cultivation and trade of pearls by using such data as the mean roughness (Ra).

关 键 词：珍珠 微观形貌 文石板块 粗糙度 AFM SEM 

分 类 号：P579[天文地球—矿物学] P578.61[天文地球—地质学]