一种电子陶瓷的分析方法  

A Method of Analysing Electronic Ceramics

作　　者：李小图[1] 孙济洲[1] 吴霞宛[1] 王洪儒[1] 

机构地区：[1]天津大学电子信息工程学院,天津300072

出　　处：《固体电子学研究与进展》2004年第4期549-553,共5页Research & Progress of SSE

基　　金：国家自然科学基金资助 (编号 :5 9782 0 0 3 )

摘　　要：对五元系统BaO PbO Nd2 O3 Bi2 O3 TiO2 进行X 射线粉末衍射分析确定系统的主次晶相分别为BaNd2 TiO14 和Bi4Ti3 O12 。用X射线衍射峰强度计算出系统中各物相的体积百分数 ,代入李赫德涅凯对数混合定则 ,定量计算出的系统介电性能与用仪器实测的相符。结果表明对于X射线衍射强度可以定量表征系统介电性能的材料 ,可以根据所需的性能指标利用李氏定则确定系统成分配比 ,从而可以作为电子陶瓷材料设计改进的依据。By X-ray diffraction analysis, the phases of BaO-PbO-Nd 2O 3-Bi 2O 3-TiO 2 system were obtained. The main phases were BaNd 2Ti 5O 14 and some were Bi 4Ti 3O 12 phase. Using diffraction peak intensity in the XRD and the Lichnetecker law, we worked out each phase percent of the material and the dielectric properties of the system. And the calculated values of dielectric properties were close to the measured results. For similar electronic ceramic material systems, the method discussed in this paper can be used to analysis the ratio of constituents and the dielectric properties.

关 键 词：BaO-PbO-Nd203-Bi203-Ti02系统 X-射线衍射强度 李赫德涅凯对数混合定则 

分 类 号：TN305[电子电信—物理电子学]