微焦点工业CT在大功率微波器件阴极检测中的应用  

APPLICATION OF MICROFOCUS INDUSTRIAL COMPUTED TOMOGRAPHY TO THE INSPECTION OF HIGH POWER MICROWAVE DEVICE CATHODE

作　　者：张红卫[1] 丁耀根[1] 白振纲[1] 

机构地区：[1]中国科学院电子所,北京100080

出　　处：《无损检测》2004年第12期599-601,604,共4页Nondestructive Testing

摘　　要：介绍计算机断层扫描(CT)的成像基本原理和设备基本组成,并用微焦点工业CT系统分析大功率微波器件阴极的内部微细结构以及它与支撑筒的焊接情况,结果证明微焦点工业CT系统在大功率微波器件阴极检测中有着良好的应用前景。The basic principles of computed tomography(CT) and its equipment constitution were described. The inner fine structure of a high power microwave device cathode and its welding condition were tested by microfocus industrial CT. Results showed the excellent application of the microfocus industrial CT to the cathode.

关 键 词：计算机断层扫描 阴极 图像分析 焊缝 

分 类 号：TG115.28[金属学及工艺—物理冶金]