X光衍射中积分强度的近似公式  

Approximate expression of integrated intensity in X-ray diffraction experiment

作　　者：罗来龙[1] 

机构地区：[1]武汉理工大学理学院,湖北武汉430063

出　　处：《大学物理》2004年第12期49-50,共2页College Physics

摘　　要：用X射线衍射仪做定量分析衍射实验时会因盖革记数器的死时间而出现漏计现象.为了简便地测定死时间,本文提出了单层膜两次照射技术,导出了校正积分强度的近似公式,并与逐次校正法作了对比分析.In quantificational diffraction experiment by X-ray diffaction meter, dead time of Geiger counter result in metrical omitting. In order to measure the dead time, a method of twice irradiation on monolayer foil is proposed, and an approximate expression is given to proofread integrated intensity, this emendation is compared with point-by-point emendation.

关 键 词：X射线 衍射 死时间 积分强度 

分 类 号：O436[机械工程—光学工程]