由少量投影重建二值截面的新方法  

New Reconstructing Algorithm of Binary Section from Few Projections

作　　者：余松煜[1] 周敏华[1] 

机构地区：[1]上海交通大学图像处理与模式识别研究所

出　　处：《上海交通大学学报》1993年第3期1-7,共7页Journal of Shanghai Jiaotong University

摘　　要：本文提出一种二值截面重建的方法.新方法针对截面二位性的特点,用模式识别方法进行截面重建。模拟结果表明,新方法有所需投影少,检出微小缺陷能力强,便于与其他先验知识相结合,以及在限角情况下仍有良好性能等优点。This paper proposes a new algorithm for reconstructing a binary section from projections. Based on the binary feature of the section, the algorithm uses pattern recognition to do reconstruction. The simulation results show that the new algorithm has the following advantages: it needs few projections, can detect fine defects and works well in the limited view condition. This paper describes the basic idea of implementing the new algorithm and presents a set of simulating results.

关 键 词：图像重建 模式识别 二值截面 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]