RTVSR纳米复合材料憎水性和电气性能研究  

Study on Hydrophobicity and Electrical Properties of RTVSR Nano-Composite

作　　者：刘海燕[1] 文习山[1] 蓝磊[1] 蔡登科[1] 

机构地区：[1]武汉大学电气工程学院,武汉430072

出　　处：《高电压技术》2005年第1期27-29,共3页High Voltage Engineering

摘　　要：利用SEM电镜测试和X射线衍射测试验证了纳米SiO2和纳米LS在RTVSR中的分散性;借助FT IR红 外光谱和光学聚焦法测试研究了RTVSR/SiO2和RTVSR/LS两种纳米复合材料的憎水性及憎水迁移性;同时测试分析了两种纳米复合材料的tanδ、ρ和耐漏电起痕等基本电气性能指标。试验证明RTVSR在改性后仍具有好的憎水性和憎水迁移性,且其电气性能指标仍符合要求。The dispersivity of nano SiO2 and nano LS in RTVSR is examined by SEM and XRD. The hydrophobicity and migration of hydrophobia of the RTV nano-composite SR/SiO2 and SR/LS are studied by FT-IR and OFF. At the same time, the basic electrical properties are tested and analyzed, such as trace of leakage current, tanδ, ρ and hydrophobia contact angle. The tests prove that RTV nano-composite SR/SiO2 and SR/LS is better in migration of hydrophobia and hydrophobicity, and their electrical properties are still at level to meet requirement.

关 键 词：室温硫化硅橡胶 纳米复合材料 憎水性 电气性能 

分 类 号：TB383[一般工业技术—材料科学与工程]