断层扫描分析法用于联用色谱二维数据的解析 Ⅱ.定量分析:原理与应用  

Resolution of Hyphenated Two-way Data Using the Slice-Scan Technique Ⅱ. Quantitative Analysis:Theory and Application

作　　者：亓云鹏[1] 宋云龙[1] 吴玉田[1] 柴逸峰[1] 李通化[2] 范国荣[1] 陆峰[1] 

机构地区：[1]第二军医大学药学院药物分析教研室,上海200433 [2]同济大学化学系,上海200092

出　　处：《分析化学》2005年第2期169-172,共4页Chinese Journal of Analytical Chemistry

基　　金：军队"十五"重点课题(No.01Z064);第二军医大学药学院"青年人才启动基金"资助项目

摘　　要：提出了一种全新的色谱 光谱二维数据信息处理手段———断层扫描分析法。本研究介绍断层扫描分 析法的定量分析原理:在重叠色谱峰簇中,每个色谱保留时间处都可得到一条光谱“断层”;针对不同的光谱 “断层”,可结合褶合曲线分析法进行定量分析,并最终获得重叠色谱峰簇中待测组分的定量信息。用断层扫 描分析法对一实验体系进行了定量分析,结果满意。The theory and application of the slice-scan technique in quantitative analysis were discussed. In the hyphenated chromatographic data, the spectral slices can be obtained from each retention time point of the chromatographic direction; hence, combining the convolution method, different strategies for different types of spectral slices were employed in the slice-scan technique, to quantitate the determined components in overlapping chromatographic peaks. An experimental system of three quinolone medicines, charactercied by an unresoloed profile of hyphenated chromatogrpahic data was quantitated using the slice-scan technique. It was shown from the results that the determined component in the overlapping chromatographic peak can be quantitated directly and successfully.

关 键 词：断层扫描 定量分析 联用色谱 重叠色谱峰 褶合曲线分析法 保留时间 光谱 二维数据 解析 实验体系 

分 类 号：O657.7[理学—分析化学]