超低副瓣阵列天线不同扫描角度幅相误差影响的研究  

Research on the effect of amplitude-phase errors on the ultra-low side-lobe arrays at different scanning angle

作　　者：崔金辉[1] 杨莘元[1] 

机构地区：[1]哈尔滨工程大学信息与通信工程学院,黑龙江哈尔滨150001

出　　处：《哈尔滨工程大学学报》2004年第6期786-788,共3页Journal of Harbin Engineering University

基　　金：国防科学技术工业委员会基础研究基金资助项目(40106030504).

摘　　要：天线阵各单元间相互耦合,使超低副瓣阵列天线的性能发生改变.传统的幅相误差分析,很少考虑互耦影响.这里在考虑互耦影响的条件下,讨论幅度误差和相位误差对超低副瓣阵列天线性能的影响.利用矩量法对天线阵列进行互耦分析,并计算了天线阵列各单元的本征激励方向图.以八单元Chebyshev等间距直线阵为例,采用本征激励分析方法进行了数值统计分析,在不同的扫描角度下,模拟得到了幅度误差、相位误差对超低副瓣阵列天线副瓣最高电平影响的关系曲线.结果表明,随着扫描角度的增加,幅相误差和互耦对天线阵的影响也逐渐增加.采用的方法是适合于阵列天线大规模数值模拟计算的有效方法.Mutual coupling between array elements has some effects on the performance of ultra-low side-lobe arrays. Analysis on the errors of an ultra-low sidelobe array antenna has been widely researched, but the effects of mutual coupling are seldom considered. Here, the eigen-driven analysis method was presented, combining Chebyshev pattern synthesis methods with method of moments. Taking into account the effects of mutual coupling between array elements, some characteristics of peak side-lobe level are summarized. Simulation results show that the effects of the mutual coupling and the amplitude-phase errors change with the scanning angle. Results indicate that the method is much more convenient, contrary to some early claims.

关 键 词：矩量法 本征激励法 互耦 超低旁瓣阵列天线 

分 类 号：TN820[电子电信—信息与通信工程]