集成半导体器件的工作稳定性与频响设计  

A Study on the Operation Stability of Integrated Semiconductor Devices and Tradeoffs for Their Frequency Response

作　　者：杨德永[1] 

机构地区：[1]西安电子科技大学,西安710071

出　　处：《微电子学》1993年第2期55-59,共5页Microelectronics

摘　　要：本文用频响特性与试验研究相结合的方法,对三个微电子产品实例进行模拟,讨论了如何设计补偿元件,防止自激振荡,保证闭环稳定且满足各项性能指标要求的问题。Three microelectronic products were modeled by means of tradeoff study on the frequency response combined with experimental study. Also discussed in the paper is the dsign of compensation elements to prevent self-excited oscillations, while maintaining close-loop stability and meeting all specifications.

关 键 词：半导体器体 频率特性 模拟试验 

分 类 号：TN303[电子电信—物理电子学]