光电测试系统的性能分析  

Performance Analysis of Photoelectric Measurement Systems

作　　者：许卫春[1] 徐可欣[1] 贺忠海[1] 

机构地区：[1]天津大学精密测试技术及仪器国家重点实验室,天津300072

出　　处：《传感技术学报》2004年第4期679-682,共4页Chinese Journal of Sensors and Actuators

基　　金：国家自然基金资助项目 (30 170 2 6 1)

摘　　要：文章从理论上分析、计算由近红外光电传感器、前置放大电路和采集卡组成的光电测试系统的精度指标。结果表明 ,系统的绝对误差为 6 6 8mV ;温度和噪声等引起的相对误差为 3 2 6mV ;此外 ,采集卡的A/D转换宽度也影响着整个系统的精度。文章分析的方法为类似测试系统的性能分析提供了一般方法。Performance of the photoelectric measurement system which is composed of a near infrared photodiode with preamp and data acquisition board, is discussed. By this method, the precision of the system can be obtained by theoretical analysis. The results show that the absolute accuracy of the system can be 6 68 mV, the relative accuracy caused by temperature fluctuation and noise is 3 26 mV. In addition, the analog to digital converter resolution makes effect on the precision of the whole system. The analysis in this article provides a general method for performance analysis of similar measuring system.

关 键 词：光电转换 测试系统 性能分析 

分 类 号：TN206[电子电信—物理电子学]