相位测量技术的新进展及其应用  

New Progress of Phase-Measuring Technique and its Applications

作　　者：金观昌[1] 

机构地区：[1]清华大学工程力学系,北京100084

出　　处：《物理》1993年第6期374-378,共5页Physics

基　　金：国家自然科学基金资助项目.

摘　　要：叙述近两年来相位测量技术的新进展．讨论了普遍采用的相移法的新算法及实现相移的多种方法，包括液晶、光纤、电光调制等新技术．文章还介绍了一些快速、简便的单条纹图处理的新途径以及误差分析的概况．最后列举了作者近年来把相位技术应用于计算机辅助光学测量──变形、应力分析、无损检测以及三维形状测量中的结果．Some of new the progress of phase-measuring techniques in nowadays are described. The phase- shifting algorithm, apparatuses(including liquid crystal cell, optic fiber), and electro-optic modulation techniques are introduced. Some fast but simple algorithm using single fringe pattern and error analysis are also presented. Results of computeraided optic metrology employing the phase technique obtained by the author for determining deformation, stress analysis, and for nondestructive testing and 3D pro- filometry are illustrated in this paper.

关 键 词：相位计量 进展 应用 相移 光学测量 

分 类 号：TB302.1[一般工业技术—材料科学与工程]