基于灵敏度的模拟电路测试参数分析  

Analysis of test parameter in analog circuit based on sensitivity

作　　者：雷勇[1] 陈光 杜天军[1] 

机构地区：[1]电子科技大学自动化学院CAT室,四川成都610054

出　　处：《系统工程与电子技术》2005年第1期13-15,共3页Systems Engineering and Electronics

基　　金：国家自然科学基金资助课题(60372001)

摘　　要：介绍了一种提取电路最佳可测性参数集以诊断电路故障的新方法。利用灵敏度法分析了电路中故障元件和可测性参数之间的关系,推导出由电路可测性参数表示的故障元件容差最大值和最小值的表示式,得到诊断故障元件的最佳可测性参数,最后利用数据优化算法得到电路故障诊断的最佳可测性参数集。利用所介绍方法分析了一个低通滤波器电路,得到诊断该电路故障的最佳参数集。由于只需较少的可测性参数即可完成电路的故障诊断,因此本方法不仅计算简单,而且可有效地缩短测试时间和降低测试成本。A new method to obtain the best testable parameter set for fault diagnosis of analog circuit is presented. Using sensitivity analysis method, the relationship between testable parameters and faulty elements in analog circuit is analyzed, then formulae of maximal and minimal values of faulty element's tolerance relative to testable parameter are concluded, and the testable parameter for diagnosing fault element is obtained, at last the best testable parameter set is got to diagnose circuit fault using data optimum arithmetic. A low-pass filter circuit is analyzed using the proposed method is analyzed, then a best testable parameter set is got. The fault in analog circuit can be diagnosed with fewer testable parameters, so this method not only has advantage of simple computation but also can effectively reduce the test cost and time.

关 键 词：灵敏度分析 故障诊断 可测性参数 

分 类 号：TN711[电子电信—电路与系统]