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作 者:吴廷华[1] 严前古[2] 张奇能[1] 茆福林[1] 郑卓群[1] 陈飞[1] 翁维正[2] 万惠霖[1]
机构地区:[1]浙江师范大学物理化学研究所,浙江金华321004 [2]厦门大学化学系固体表面物理化学国家重点实验室,福建厦门361005
出 处:《催化学报》2004年第12期928-930,共3页
基 金:国家重点基础研究发展规划 (G19990 2 2 40 8)资助项目
摘 要:FT-IR spectroscopy is employed to investigate the methane dissociation and methane partial oxidation over the Rh/SiO 2 catalyst. When CH 4 is adsorbed onto the catalyst surface, it dissociates into adsorbed CH x (x=1~3) and atomic hydrogen on Rh surface. Atomic hydrogen can diffuse from Rh surface to SiO 2 surface where a proton exchange reaction of H with the surface Si-OH occurs, or it reacts with the lattice oxygen of SiO 2 to form new Si-OH.FT-IR spectroscopy is employed to investigate the methane dissociation and methane partial oxidation over the Rh/SiO 2 catalyst. When CH 4 is adsorbed onto the catalyst surface, it dissociates into adsorbed CH x (x=1~3) and atomic hydrogen on Rh surface. Atomic hydrogen can diffuse from Rh surface to SiO 2 surface where a proton exchange reaction of H with the surface Si-OH occurs, or it reacts with the lattice oxygen of SiO 2 to form new Si-OH.
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