红外焦平面非均匀性两点校正法分析及FPGA实现  

Study on Two-points Nonuniformity Correction Algorithm for IRFPA and Implementation by Using FPGA

作　　者：石岩[1] 张天序[1] 王岳环[2] 江浩洋[1] 

机构地区：[1]华中科技大学图像识别与人工智能研究所,湖北武汉430074 [2]华中科技大学图像信息处理与智能控制教育部重点实验室,湖北武汉430074

出　　处：《激光与红外》2005年第2期100-103,共4页Laser & Infrared

基　　金：本项目受国家自然科学基金重点项目 (No.60135020)资助。

摘　　要：在分析了IRFPA有效像元的响应系数与两点法校正系数之间的关系后,指出两点法校正系数的取值范围或动态范围。在此基础上提出了一种在确保一定精度同时又尽量节省资源的前提下,将浮点校正运算近似成定点运算的方法,并分析了定点近似与计算精度之间的关系。依据该方法针对实际IRFPA,设计实现了FPGA硬件校正模块。实验表明该方法是有效的。In the paper, the relationship between response coefficients and two-points’ correction coefficients for effective pixels is investigated, and the range of two-points’ correction coefficients is found out. To economize hardware resource and ensure the appointed correction precision at the same time, an approach for transforming NUC scheme from float operation to integer one is studied, and the relationship between precision loss and integer approximation is discussed. Then the correction integer formula deduced from this approach is implemented by FPGA(field programmable praphic array). The experiment results using real IRFPA show the proposed approach is feasible.

关 键 词：红外焦平面阵列 非均匀性校正 两点校正法 FPGA 

分 类 号：TN215[电子电信—物理电子学]