基于面阵CCD的不规则平面物体面积测量仪的研制  

The Development of an Instrument for Anomalistic Area Measurement Based on Matrix CCD

作　　者：赵立生[1] 杜安[1] 张伟[1] 

机构地区：[1]哈尔滨工业大学航天学院,哈尔滨150001

出　　处：《中国仪器仪表》2005年第1期69-72,共4页China Instrumentation

摘　　要：介绍了一种基于面阵CCD的高性能面积测量仪的研制。详细阐述了有关的工作原理和关键技术。本光电仪器充分应用了PIC单片机自身的软硬件资源,具有便携式、可编程、存储容量大、图文显示等特点,并可推广应用于其他领域。The development of a high quality area measurement instrument based on matrix CCD and used for a type of military product is introduced.The relational work principle and key technology are expatiated detailedly.The soft and hard resources of PIC MCU are made full use by this instrument. Its main characteristics are portable, programmable, with large memory capacity, able to display image and character and so on. It can be used in other domain also.

关 键 词：PIC单片机 存储容量 面阵CCD 显示 可编程 光电 软硬件 量仪 平面 高性能 

分 类 号：TH713[机械工程—测试计量技术及仪器]