微光综合测试仪  

LOW-LIGHT-LEVEL SYNTHETIC TEST INSTRUMENT

作　　者：周仲贤 金峰 

机构地区：[1]湖光仪器厂

出　　处：《应用光学》1993年第2期21-27,共7页Journal of Applied Optics

摘　　要：分析GJB851-90《夜视仪通用规范》规定的测试方法及所使用的仪器,指出了这种测试方法所存在的缺陷。从测试仪器通用化观点出发,对所使用的观测仪器作了分解和简化,对测试方法也作了改进。以此为基础,讨论微光综合测试仪系列,并对测仪器的主要部件作详细的说明。The test method and instruments given in GJB851-90 are analysed, the disadvantages of such a test method are found. Then the observing instrument is resolved and simplified for the general purpose of test instrument, the test method is also improved. The low-light-level synthetic test instruments are discussed on the basis of above, and the main parts of the instrument are explained in detail.

关 键 词：测试仪 夜视仪 微光观察仪 

分 类 号：TN223[电子电信—物理电子学]