Y稳定的ZrO_2基体上YBa_2Cu_3O_7／SrTiO_3／YBa_2Cu_3O_7异质外延三层膜的制备、超导性能和显微结构  

PREPARATION, SUPERCONDUCTIVITY, MICROSTRUCTURE OF HETEROEPITAXIAL YBa_2Cu_3O_7/SrTiO_3/YBa_2Cu_3O_7 TRILAYER THIN FILMS GROMN ON Y-STABILIZED ZrO2 SUBSTRATE

作　　者：郭丽萍 刘贵荣[1] 易怀仁 陈烈[1] 李建奇[1] 李林[1] 周玉清[1] 杨晔[1] 

机构地区：[1]中国科学院物理研究所

出　　处：《低温物理学报》1994年第4期252-258,共7页Low Temperature Physical Letters

摘　　要：采用磁控溅射方法在（１００）ＹＳＺ基底上沉积了ＹＢａ２Ｃｕ３Ｏ７／ＳｒＴｉＯ３／ＹＢａ２Ｃｕ３Ｏ７异质外延三层膜，利用交流磁化率和四引线电阻测量的方法确定了三层膜的超导性能，利用Ｘ射线衍射和透射电子显微镜研究了三层膜的结构特征．研究结果表明，膜层的结晶质量较好，临界转变温度Ｔｃ在８３．Ｋ和８６．７Ｋ之间．ＹＢＣＯ膜层中的绝大多数甚至全部）晶粒为Ｃ取向，在有些膜中只存在少量的ａ或ｂ取向的ＹＢＣＯ晶粒．三层膜中层界面比较清晰但不十分平整．在膜／基界面处有８－１０ｎｍ厚的过渡层，它由多晶的ＢａＺｒＯ３组成．膜层和（１０）ＹＳＺ基底之间具有如下的外延生长关系ＹＳＺ［００１］／／ＹＢＣＯ［１１０］／／ＳｒＴｊＯ３［１１０］；ＹＳＺ（１００）／／ＹＢＣＯ（００１）／／ＳｒＴｉＯ３（００１）．Abstract Heteroepitaxial YBa2Cu3O7 /SrTiO3/YBa2Cu3O7 trilayer thin films were deposited on (100) Y- stabilized ZrO2(YSZ) substrates by the magnetron sputtering technique. The superconducting properties of the trilayer thin films were determined by both the a. c. susceptibility and redsistive measurements. X-ray diffraction and transmission electron microscopy were used to characterize the structure and microstructure of the inlayer thin films. The experimental results showed that the growth quality of the inlayer films was quite good. The critical superconducting transition temperature T. of the films were between 83. 5K and 86. 7K. The YBCO layers were mainly c axis oriented with c -axis perpendicular to the substrate surface, however some a or b -axis oriented YBCO grains appeared in the trilayer films. Distinct layered structUre was observed by using XTEM method. The interface between two edjacent layers were quite sharp but somehow irregular. There was a 8-10nm thick transition layer of polycrystalline BaZrO3 at the YBCO/substrate interface. The epitaxial growth relationships among the YSZ substrate, the YBCO and STO layers were:[001] YSZ

关 键 词：超导膜 YBCO 超导性 显微结构 

分 类 号：O511.1[理学—低温物理]