阴极铝箔化学腐蚀工艺研究──Ⅱ．关于阴极铝箔容量衰减问题  

Study on the Chemical Etching Technology of Cathode Aluminium Foil──Ⅱ.Drop of the Capacitance of Cathode Foil

作　　者：沈行素 蒋建新 严季新 李立新 吴琦 

机构地区：[1]南通电极箔厂

出　　处：《电子元件与材料》1994年第4期45-49,共5页Electronic Components And Materials

摘　　要：在３０％酒石酸铵溶液中用恒定阳极电流测定阴极箔的计时电压（Ｅ－ｔ）曲线，根据曲线转折电压Ｅ转判断表面氧化膜相对厚度，发现膜厚与电容量有很好对应关系。用ｐＨ＝２磷酸钝化液处理的箔在刚生产出来时表面氧化膜很薄，随时间增厚，容量下降幅度大。改用ｐＨ＝３．４磷酸钝化液，形成的氧化膜较厚，较稳定，容量下降得到改善。对此作了分析探讨。With the aid of determination of chronopotentiogram (E-t curve) at cathode aluminium foil by stable anode current in 30 percent ammonium tartrate solution and from a judgement of relative thickness of oxide film at the surface upon pressure E on turning point of the curve it is observed that thickness of the film closely corresponds to capacitance of the capacitor. At the beginning of treating out foil passivated in phosphoric acid solution with pH=2 oxide film on the film surface is very thin, thicken with time and it's capacitance drops rapidly. If passivated in phosphoric acid solution with PH=3.4, formed film is thicker and more stable, it's capacitance drops slowly. This phenominon is analysised and discussed in this paper.

关 键 词：阴极 铝电解电容器 化学腐蚀 

分 类 号：TM535.1[电气工程—电器]