ICP－AES中基体元素对硫的光谱干扰（Ⅱ）  

Spectral Interference to Sulphur from Matrix Elements in ICP-AES

作　　者：卢汉兵[1] 张保军[1] 魏路线[1] 

机构地区：[1]武汉华中师范大学分析测试中心,武汉工学院微观分析中心

出　　处：《高等学校化学学报》1994年第8期1149-1151,共3页Chemical Journal of Chinese Universities

摘　　要：ＩＣＰ－ＡＥＳ中基体元素对硫的光谱干扰（Ⅱ）卢汉兵张保军，魏路线（武汉华中师范大学分析测试中心，武汉，４３００７０）（武汉工学院微观分析中心）关键词电感耦合等离子体发射光谱，光谱干扰，硫ＩＣＰ－ＡＥＳ中，由于对２００ｎｍ以下的光谱干扰研究工作报道极少...The spectral interferences to sulphur from 16 elements(Sm,Er,Yb,La,Y,Ba,Se,Cr,Tb,Zn,Fe,Cu,Cd,K,Na and P)were studied.It was found that there were interference lines from above mentioned 16 elements at 182. 036 nm±0. 035 nm. So far the spectral interference to sulphur from matrix elements in the region of wavelength shorter than 200 nm has been seldom reported for inductively coupled plasma(ICP) source. Our results show that if the wavelength difference between interference line and analytical line is equal to or less than 0.002 nm,a severe spectral overlapping interference will he seen.The results can be made use of in determining sulphur in 16 matrix elements mentioned above andavoid the spectral interference from them.

关 键 词：硫 ICP-AES 光谱干扰 基体元素 

分 类 号：O657.3[理学—分析化学]