PMN-PZN-PT系弛豫铁电陶瓷的介电老化  

Research on Dielectric Aging Behavior of PMN-PZN-PTFerroelectric Relaxor Ceramic for 25U MLC

作　　者：王雨[1] 桂治轮[1] 李龙土[1] 张孝文[1] 

机构地区：[1]清华大学材料系

出　　处：《高技术通讯》1994年第3期17-20,共4页Chinese High Technology Letters

基　　金：863计划及国家教委重点博士点基金

摘　　要：对一种满足２５Ｕ电容标准的ＰＭＺＮ陶瓷的个电老化行为特卢、进行了研究，并分析了材料组成、外电场及温度等因素对其老化行为的影响。研究发现，材料老化是由掺杂（ＭｎＯ２、ＭｇＯ）所诱导，其老化行为与正常铁电体有一定差异。he aging behavior of Ph (Mg1/3Nb2/3 ) O3-Pb (Zn1/3Nb2/3 ) O3-PbTiO3 ceramic for 25U multilayer capacitors and the influences of the compound composition, aging temperature and testing electric field onaging behavior were studied. It was found that the aging was induced by the dopants of MnO2and MgO andthere was difference in aging behavior between this ferroelectric relaxor and normal ferroelectric BaTiO3.

关 键 词：弛豫 铁电陶瓷 介电性 老化 

分 类 号：TM28[一般工业技术—材料科学与工程]