超薄窗Si（Li）探测器在实验中的应用  

Application of ultra-thin window Si(Li) detector in some experiments

作　　者：刘惠珍[1] 朱福英[1] 朱德彰[1] 曹德新[1] 沈浩元[1] 浦世节[1] 

机构地区：[1]中国科学院上海原子核研究所

出　　处：《核技术》1994年第4期242-245,共4页Nuclear Techniques

摘　　要：用超薄窗Ｓｉ（Ｌｉ）探测器测量低能Ｘ射线，将传统的ＰＩＸＥ谱测量范围推广到如Ｓｉ、Ａｌ、Ｎａ等低原子序数元素。还对超薄窗Ｓｉ（Ｌｉ）探测器的具体应用作了描述。An ultra-thin window Si(Li) detector used for measuring low energy X-rays is designed. The PIXE spectrum range has extended to still lower energies of characteristic X-rays originated from St, Al and Na. Some practical applications of the detector are also presented.

关 键 词：超薄窗 探测器 PIXE分析 硅 

分 类 号：TL814[核科学技术—核技术及应用]