和型莫尔偏折术的探讨  

On an Additive Type of Moire Deflectometry

作　　者：杨坤涛[1] 廖兆曙[1] 陶景光[1] 

机构地区：[1]华中理工大学光学工程系

出　　处：《华中理工大学学报》1994年第4期101-104,共4页Journal of Huazhong University of Science and Technology

摘　　要：探讨了一种和型莫尔偏折术．将两组周期相同的干涉条纹同时投射到接收面上，让光强相加而得到莫尔条纹．分析了其原理，并用计算机进行了模拟．An additive type of Moire deflectometry for measuring the phase of an object is suggest-ed. When two sets of interference fringes are projected together on a receiver,their intensi-ties are superimposed by addition and Moire fringes are generated.Moire fringes will be de-flected if a phase object is put into one of two interference fields. The equation for the addi-tive type Moire fringe is described and the Moire patterns are simulated with a computer.

关 键 词：莫尔条纹 莫尔偏折术 光学 干涉 

分 类 号：O436.1[机械工程—光学工程]