ICP-AES测定高纯碲中11种杂质元素  

Determination of Eleven Impurity Elements in High Purity Tellurium by ICP-AES

作　　者：张朝阳[1] 马名扬[1] 苏流坤[1] 

机构地区：[1]广东省生态环境与土壤研究所分析测试中心,广州市天源路808号510650

出　　处：《光谱实验室》2005年第1期134-136,共3页Chinese Journal of Spectroscopy Laboratory

摘　　要：电感耦合等离子体原子发射光谱法 (ICP- AES)同时测定高纯碲中 11种杂质元素。用离峰扣背景法消除背景干扰 ,检出限能满足高纯碲中杂质元素的测定要求 ,加标回收率在 94 .0 %— 10 8%之间。The eleven impurity elements in high purity tellurium were determined by ICP-AE S.The interference of background was corrected by off-peak background correctio n.The detection limits are suitable for the detection of impurity elements in hi gh purity tellurium.The recoveries are in the range between 94.0% and 108%.

关 键 词：高纯 杂质元素 ICP-AES 同时测定 检出限 ICP—AES 电感耦合等离子体原子发射光谱法 要求 消除 干扰 

分 类 号：O657[理学—分析化学]