阻抗加载对导体柱微波成像的影响  

Effects of Impedance Loading on Microwave Imaging of Conducting Cylinders

作　　者：殷红成[1] 黄培康 肖志河 

机构地区：[1]成都电子科技大学二系,北京航天工业总公司二院

出　　处：《系统工程与电子技术》1994年第6期62-71,共10页Systems Engineering and Electronics

摘　　要：本文研究阻抗加载对雷达目标微波成像的影响。首先以一个表面多阻抗加载导体圆柱为例，详细分析了它在不同加载波参数下的理论成像结果，然后讨论了在微波暗室中对实际缩比模型的实验成像结果。研究表明，有载目标将对成像制导技术带来很大威胁，加载技术可使目标强散射源平滑，产生分布式多散射源甚至扩展到目标尺度以外。因此，有载目标微波成像及其特征提取是一个新的研究方向。The effects of impedance loading on microwave imaging of radar target are inves-tigated.The theoretical imaging results of a conducting circular cylinder loaded by multiple surfaceimpedances are analyzed in detail for various loading parameters,and the experimental ones of sev-eral scale cylinders loaded by multiple cavity-backed slots also discussed.It is shown that,loadingtechnology makes the strong scattering sources of odject smooth,and produces multiple distributedscattering sources that even lie beyond the extent of object,which brings about a serious threat toimaging and guidanee techniques of radar target.Therefore,it is a new subject to study microwaveimaging and signature extraction of loaded targets.

关 键 词：微波成像 雷达目标 电磁波散射 阻抗加载 

分 类 号：TN957.51[电子电信—信号与信息处理]