自组装单分子膜及其表征方法  

Self-Assembly Monolayers and Their Characterization

作　　者：张俊苓[1] 杨芳[1] 郑文杰[1] 白燕[1] 欧阳健明[1] 

机构地区：[1]暨南大学化学系,广州510632

出　　处：《化学进展》2005年第2期203-208,共6页Progress in Chemistry

基　　金：国家自然科学基金资助项目 (No.2 0 2 710 2 2 );广东省自然科学基金资助项目 (No .0 10 36 9)

摘　　要：自组装单分子膜的研究是近年来十分活跃的研究领域。随着膜的应用领域的拓展 ,对膜的表征方法不断提出新的要求。本文综述了自组装单分子膜体系的类型和基底表面的处理方法 ,着重从电化学、谱学、显微学以及表面润湿性等方面综述了近几年来自组装单分子膜的表征方法研究进展 ,并对其发展前景作了展望。The study on self-assembly monolayers (SAMs) is an active field in recent years. With the development of the SAMs, new methods for characterization of SAMs are urgent to come out. In this paper, the characterization methods on SAMs in recent years by the means of electrochemistry, spectroscopy, micrology and surface wettibility are reviewed. The types of SAMs and the treatment to the substrate surface are summarized. The potential development of the SAMs is also proposed.

关 键 词：自组装单分子膜 体系类型 基底表面 表征方法 

分 类 号：O657[理学—分析化学] O641.3[理学—化学]