制冷红外焦平面和热像仪的性能评价与验收  

Performance evaluation and acceptance of cooled infrared focal plane array and thermal imager

作　　者：李颖文[1] 潘德彬[1] 刘爱东[1] 罗艳[1] 

机构地区：[1]华中光电研究所,湖北武汉430073

出　　处：《光学技术》2005年第2期206-207,共2页Optical Technique

摘　　要：在对进口的制冷红外焦平面和红外热像仪进行性能评价与验收中,针对存在的问题,提出了一种新的基于制冷红外焦平面工作温度的简单易行的评价方法。通过测试制冷红外热像仪的两个关键指标,即制冷时间和探测器的工作温度,可以判断制冷红外热像仪是否合格,解决了在制冷红外热像仪验收过程中出现的问题。In order to settle the problem in the performance evaluation and acceptance of cooled infrared focal plane array and thermal imager which are bought from abroad, a new simple and practical evaluation method based on the working temperature of the cooled focal plane array is proposed. The method is ratified by the supplier.

关 键 词：制冷 红外焦平面 热像仪 性能评价 验收 

分 类 号：TN216[电子电信—物理电子学]