Efficient RT-Level Fault Diagnosis  

作　　者：OzgurSinanoglu AlexOrailoglu 

机构地区：[1]ComputerScienceandEngineeringDepartment,UniversityofCalifornia,SanDiego,LaJolla,CA92093,U.S.A.

出　　处：《Journal of Computer Science & Technology》2005年第2期166-174,共9页计算机科学技术学报（英文版）

摘　　要：Increasing IC densities necessitate diagnosis methodologies with enhanceddefect locating capabilities. Yet the computational effort expended in extracting diagnosticinformation and the stringent storage requirements constitute major concerns due to the tremendousnumber of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capableof responding to these challenges. In the proposed scheme, diagnostic information is computed on agrouped fault effect basis, enhancing both the storage and the computational aspects. The faulteffect grouping criteria are identified based on a module structure analysis, improving thepropagation ability of the diagnostic information through RT modules. Experimental results show thatthe proposed methodology provides superior speed-ups and significant diagnostic informationcompression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosisapproaches.Increasing IC densities necessitate diagnosis methodologies with enhanceddefect locating capabilities. Yet the computational effort expended in extracting diagnosticinformation and the stringent storage requirements constitute major concerns due to the tremendousnumber of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capableof responding to these challenges. In the proposed scheme, diagnostic information is computed on agrouped fault effect basis, enhancing both the storage and the computational aspects. The faulteffect grouping criteria are identified based on a module structure analysis, improving thepropagation ability of the diagnostic information through RT modules. Experimental results show thatthe proposed methodology provides superior speed-ups and significant diagnostic informationcompression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosisapproaches.

关 键 词：fault diagnosis RT-level diagnosis fault dictionary fault simulation dictionary compaction fault bit location tracing 

分 类 号：TN407[电子电信—微电子学与固体电子学]