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作 者:方铭[1] 王现英[1] 李青会[1] 沈德芳[1] 干福熹[1]
机构地区:[1]中国科学院上海光学精密机械研究所,上海201800
出 处:《功能材料与器件学报》2005年第1期75-78,共4页Journal of Functional Materials and Devices
摘 要:实验设计并组建了一套磁光极克尔磁滞回线测量装置,该装置可以通过改变照射到样品上的激光功率来改变薄膜样品上被聚焦光斑照射的测试点的温度。同时通过计算模拟了激光照射在TbFeCo磁光薄膜上的温度分布情况,得到了薄膜的矫顽力随照射激光功率的变化关系,由此可以确定薄膜的居里温度和补偿温度。为研究磁光薄膜样品在各种温度条件下,磁光性能的变化以及多层磁光薄膜的磁耦合效应提供了有效的手段。A set of apparatus for measuring magneto-optical polarizing Kerr hysteresis loop was designed and built up. By adjusting laser power, it can change the temperature of tested points of thin film samples irradiated by focusing light. The distribution of temperature within TbFeCo magneto-optical film irradiated by laser is simulated by calculating. The relationship between film coercive force and irradiating laser power is obtained. According to it, the Curie temperature and compensation temperature of films are determined. It presents an effective way to study the variation of magneto-optical characteristics of films under different temperatures and the magnetic coupling properties of multiplayer magneto-optical films.
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