插值细分方法在激光衍射测量中的应用研究  

Application study of equidistance subdivision in laser diffraction measurement

作　　者：贺国权[1] 

机构地区：[1]涪陵师范学院物理系,重庆408003

出　　处：《传感器技术》2005年第3期10-12,共3页Journal of Transducer Technology

基　　金：重庆市高等学校优秀中青年骨干教师资助计划项目(渝教人2003-2);重庆市教委科学技术研究项目(041303)

摘　　要：在激光衍射法测量微细线径的基础上,提出用硬件插值细分的方法来确定衍射图样暗纹间距。介绍了激光衍射法测量微细直径的原理,分析了图像传感器的功能和硬件插值细分的机理,给出了插值细分的电路框图。实验结果表明:采用插值细分的方法能够提高图像传感器的分辨力和细丝直径的测量精度。Be based on measuring wire tiny diameter with laser diffraction,a method of hardware equidistance subdivision for dark string spans of diffraction fringe is presented.The principle of measuring the tiny diameter with laser diffraction method is introduced,the mechanism of hardware equidistance subdivision and the function of image sensor are analyzed,and the circuit diagram is given.This test results show that the method of equidistance subdivision can highly improve the resolution of the image sensor and the measurement accuracy of the wire tiny diameter.

关 键 词：激光衍射 暗纹间距 固体图像传感器 插值细分 

分 类 号：TH821[机械工程—仪器科学与技术]