彩色显像管电子束配列智能测试系统研制  

Development of Intelligent Measuring System for C PT Purity

作　　者：童清化[1] 应根裕[1] 汪健如[1] 

机构地区：[1]清华大学电子工程系,北京1000084

出　　处：《电子器件》2005年第1期1-5,共5页Chinese Journal of Electron Devices

摘　　要：通过使用CCD采集电子束图像,来测试电子束着屏误差、电子束宽度、电子束配列因子、黑底配列因子和黑底条宽等五个参数,本系统由计算机作为控制核心,通过专用软件进行实时测量,大大提高了测试效率,实现多参数、全自动测量。针对系统研制过程中的核心问题,文中主要对系统聚焦和图像处理部分进行了讨论。An intelligent measuring system for CPT parameters of electron beam is presented. It gets the image of electron beam through the CCD camera to measure the landing error, width and GR gene of the electron beam, at same time, it can also measure the GR gene and width of the graphite. As multifunctional equipment, it employs the computer as the core of controller, so it can automatically measure many parameters at same time, the efficiency enhanced greatly. Here we'll focus on the parts of lens focus and image process, then give the measuring results.

关 键 词：彩色显像管 色纯 着屏误差 配列因子 自动聚焦 

分 类 号：TN141.3[电子电信—物理电子学]