近衍射极限半导体激光束波面检测  

Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam

作　　者：刘宏展[1] 刘立人[1] 徐荣伟[1] 栾竹[1] 滕树云[1] 

机构地区：[1]中国科学院上海光学精密机械研究所信息光学研究室

出　　处：《中国激光》2005年第4期519-522,共4页Chinese Journal of Lasers

基　　金：上海市科委重点科技项目(012261011)资助项目。

摘　　要：在星间半导体激光通信系统中,如何检测发射光束波面的质量是个较难处理的问题,为了较好地解决这一问题,在简单介绍白光横向双剪切干涉仪的基础上,报道了用此干涉仪对近衍射极限半导体激光光束波面的检测,在此基础上推导出计算远场发散度的公式。实验测得近场光束的波高差为0.2λ,通过夫朗和费衍射求得光束的发散度仅为64.8μrad,这表明光束接近光学衍射极限。同时,表明双剪切干涉仪灵敏度高、实用性好。In the semiconductor intersatellite communication system, how to test the laser beams quality is difficult. In order to solve this problem, a basal principle of the white light lateral double-shearing interferometer is introduced firstly, and then measuring the semiconductor laser beam's wavefront which is near the diffraction-limited by the interferometer is reported, and the formula of calculating the beam's divergence is deduced according to the Fraunhofer diffraction. A 0.2 λ wavefront error is gained experimentally. Corresponding to the wavefront error, the divergence angle is only 64.8 μrad, which indicates the beam is near the diffraction-limited. The result shows that the interferometer has high precision and wide practicability.

关 键 词：光通信 双剪切干涉仪 发散度 衍射极限 

分 类 号：TN929.13[电子电信—通信与信息系统] O436.1[电子电信—信息与通信工程]