饱和电抗器特性单片机测试仪研究  

Study of Single-chip Processor Instrumentation of Saturable Reactor Property

作　　者：张俊峰[1] 毛承雄[1] 陆继明[1] 李维波[1] 

机构地区：[1]华中科技大学电气与电子工程学院,武汉430074

出　　处：《电力系统及其自动化学报》2005年第2期58-62,共5页Proceedings of the CSU-EPSA

基　　金：国家自然科学基金资助项目(60274037)

摘　　要：介绍一种研究可控饱和电抗器输出特性的单片机测试仪,用于检测并处理可控饱和电抗器中的感应线圈电压波形的平均值、有效值。当交流激励直接让饱和电感处于饱和状态时,研究感应线圈电压与直流偏磁磁势之间的关系曲线,并绘制它的开环输出特性。An instrumentation based on single-chip processor is presented for studying the output property of saturable reactor.The instrumentation can play in important role in dealing with RMS value of the induced voltage of the coil in the saturable reactor. The relation curve between induced voltage RMS and DC is given.Experimental results verify the correctness of the instrumentation.

关 键 词：饱和电抗器 输出特性 单片机 测试仪 

分 类 号：TM933.1[电气工程—电力电子与电力传动]