小角散射实验应用成像板探测器测量绝对强度的方法  

Measurement of Absolute intensity with image plate detector insmall-angle scattering experiments

作　　者：刘开源[1] 

机构地区：[1]鞍山师范学院物理系,辽宁鞍山114005

出　　处：《物理实验》2005年第4期37-39,共3页Physics Experimentation

摘　　要：利用衰减法,设计了以第一电离室的计数归一化入射光束强度,用成像板计数单位记录入射光束强度的方案,并用Si片衰减进行了实验,结果表明本文提出的方案能够获得合理的绝对强度.The intensity is calibrated with image plate count unit, and is normalized by the count of an ion chamber positioned in front of the Absorption foils. Silicon foils are used to carry out the experiment, and the results demonstrate that the experimental scheme can obtain reasonable Absolute intensity.

关 键 词：小角散射 绝对强度 衰减法 成像板 

分 类 号：O434.1[机械工程—光学工程]