纳秒激光等离子体光源的光谱测量技术  

Technology for measuring spectrum from nanosecond laser plasma soft X-ray source

作　　者：尼启良[1] 

机构地区：[1]中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,吉林长春130033

出　　处：《光学精密工程》2005年第2期211-218,共8页Optics and Precision Engineering

基　　金：国家自然科学基金重点项目资助(No.60223003);应用光学国家重点实验室基金

摘　　要：提出了一种新的探测和测量激光等离子体软X射线源光谱强度的方法。此方法使用通道电子倍增器和定标过的硅光电二极管为探测器,前者是非标准探测器,后者为标准探测器。应用电荷灵敏前置放大器和峰值探测器测量探测器产生的电量,并以高分辨率的光谱仪为分光元件,在已知光栅效率、通道电子倍增器增益、硅光电二极管能量响应的条件下,给出了计算激光等离子体软X射线源在某一波长光谱强度的公式。A method detecting and measuring the intensity of spectrum from laser plasma soft X-ray source is presented. A channel electron multiplier (CEM) and a calibrated silicon photodiode are used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers and peak detector are used for measuring total charges generated by detectors, and a monochromator with high resolution is employed as spectrometer, formulae to calculate the intensity of spectrum from laser plasma soft X-ray source is given, based on known the grating efficiency of monochromator, CEM's gain and responsivity of silicon photodiode to photons.

关 键 词：软X射线源 激光等离子体 光谱强度 峰值探测器 

分 类 号：O536[理学—等离子体物理]