X射线荧光光谱法测定阳极铜各成分  

Determination of components in anode copper by XRF

作　　者：李莎莎[1] 陈卫东[2] 

机构地区：[1]上海材料研究所检测中心,上海200437 [2]华东理工大学分析测试中心,上海200237

出　　处：《冶金分析》2005年第2期47-50,共4页Metallurgical Analysis

摘　　要：研究了X射线荧光光谱法测定阳极铜时样品表面处理的方法,程序设计过程中基体、谱线干扰,分析低含量元素时谱线背景的扣除等问题;对基体铜的测定采用了标准归一法;测定了阳极铜标样中20种元素,测定结果与推荐值一致,RSD为0 1%～6 0%;实测了阳极铜熔炼过程中不同阶段的5个样品,结果满意。The surface treatment technique of sample in analysis of anode copper by XRF, the interferences of matrix and spectral lines, the subtraction of spectral background in the measurement of low content elements and so on, were studied. Normalization method was applied for copper measurement. Twenty elements in a reference sample of anode copper were determined. The determined results are identical with recommendations. RSD is 0.1% -6.0%.Five different samples during melting were determined with satisfactory results.

关 键 词：X射线荧光光谱法 阳极铜 成分 低含量元素 表面处理 设计过程 谱线干扰 测定结果 熔炼过程 归一法 推荐值 RSD 样品 基体 标样 

分 类 号：TG115.22[金属学及工艺—物理冶金]