一种反铁电液晶薄膜相变过程的变温红外光谱研究  

Temperature-denpendent FTIR Spectroscopy Phase Transition Process of Thin Films of Antiferroelectric Liquid Crystal

作　　者：程昱川[1] 徐蔚青[1] 孙丽[1] 王旭[1] 赵冰[1] 

机构地区：[1]吉林大学超分子结构与材料教育部重点实验室,长春130023

出　　处：《高等学校化学学报》2005年第5期931-934,F008,共5页Chemical Journal of Chinese Universities

基　　金：国家自然科学基金(批准号:20173019;20273022;20375014;20473029)资助

摘　　要：通过变温红外光谱对反铁电液晶MHOCPOOB薄膜相变过程中的分子构象、排布及相互作用的变化进行了研究.结果表明,室温时,薄膜中的分子烷基链同时含有zigzag和gauche两种构象.随着温度的升高,有序的zigzag构象转化为无序的gauche构象,链的扭曲程度增加.但S*IA到S*CA的转变并不引起烷基链构象和取向发生明显变化.刚性核中的羰基与相邻的苯环形成共轭体系,苯环之间相互倾斜排列,在相变过程中羰基与苯环的共平面作用逐渐被打破,且在相变点苯环间的二面角明显增大.The conformation and orientation of the alkyl chain and the core of AFLC were studied by temperature-dependence spectroscopy. The conformation and orientation of the alkyl chain changed obviously as the temperature increased except the phase transition point between the S~*_(IA) and S~*_(CA). Three CO stretching vibrational modes gave two different phase transition behavior. The phase transition between increasing and decreasing temperature was quite different, this is due to the influence of substrate.

关 键 词：变温红外光谱 铁电液晶 相变 

分 类 号：O657.37[理学—分析化学]