IC优化设计及其成品率预测  

Optimization Design and Yield Forecast for IC

作　　者：段旭朝[1] 赵天绪[1] 

机构地区：[1]宝鸡文理学院计算信息科学研究所,陕西宝鸡721007

出　　处：《微电子学与计算机》2005年第4期67-71,共5页Microelectronics & Computer

基　　金：陕西省自然科学基金(2002F30);陕西省教育厅科研计划项目(02JK194)资助

摘　　要：IC成品率是与电路性能和制造成本及制造效益紧密相关的一个重要因素,在进行IC优化设计时,可将成品率与制造效益作为协调各性能指标的优化目标。针对这一问题,本文完善了IC成品率效益协调优化设计模型,提出了一种实现该模型的IC优化设计和成品率预测方法,并利用OrCAD/PSpice中的统计分析和电路性能分析的功能和特点,建立了相应的算法。实例表明,该方法及其实现算法是有效的。Yield of IC is an important factor related with circuit performance , manufacturing cost and income, so the yield and income of IC is an optimization objective to compromise all circuit performance in IC optimization design. The available model of tradeoff optimization of yield and income is improved and a method of IC optimization design and yield forecast is presented. Based on the function and characteristic of statistic analysis and circuit performance analysis in OrCAD/PSpice9, the algorithm of IC optimization design and yield forecast is established. It is illustrated that the model and algorithm are effective.

关 键 词：成品率 效益 优化设计 蒙特卡罗分析 性能综合指数 

分 类 号：TN4[电子电信—微电子学与固体电子学]