合肥光源用于束团截面及发射度测量的图像采集系统  

Imaging Acquirement System Applied to Beam Profile and Emittance Measurement for HLS

作　　者：郑普[1] 孙葆根[1] 卢平[1] 

机构地区：[1]中国科学技术大学国家同步辐射实验室,安徽合肥230029

出　　处：《测控技术》2005年第5期24-26,39,共4页Measurement & Control Technology

基　　金：中国科学院知识创新资助项目(KY4206)

摘　　要：介绍了合肥光源用于束团截面及发射度测量的图像采集系统。该系统首先将由光学成像系统得到的1:1成像的同步光用CCD相机转换成视频信号,再将该视频信号输出到图像采集卡进行图像采集,然后由LabVIEW程序进行图像采集及数据处理获得束团截面尺寸以及束流的发射度和耦合度。该系统可以实时显示束团截面形状以及测得的束团截面尺寸、发射度和耦合度,同时可以进行图像离线分析。另外,根据束流流强和同步光光强的线性关系对CCD的非线性进行标定。Imaging acquirement system applied to beam profile and emittance measurement for HLS(Hefei Light Source) is described. The system receives PAL signal from the CCD camera which acquired the synchrotron light imaging through the imaging optical system and uses the PAL signal to acquire the video signal. Then, the signal is processed by a LabVIEW program to calculate the beam profile size,the emittance and coupling. The system can display the beam profile size, emittance and coupling real time, and analyze the image offline. In ad- dition, the non-linearity of the CCD is corrected accord- ing to the linearity of beam intensity and light intensity.

关 键 词：图像采集 束团截面 发射度 耦合度 LABVIEW 

分 类 号：TL594[核科学技术—核技术及应用] TL506