硫化铅超细纳米带和纳米线的TEM表征  

TEM characterization of ultra small lead sulfide nanobelts and nanowires

作　　者：张华[1] 左鸣[1] 李公普[1] 谭舜[1] 张庶元[1] 

机构地区：[1]中国科学技术大学理化科学中心,安徽合肥230026

出　　处：《电子显微学报》2005年第2期108-113,共6页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.50132030).~~

摘　　要：本文报道了硫化铅超细纳米带和纳米线的电镜研究结果。纳米带宽度小于20nm,纳米线直径约30nm,轴向生长方向均为[110]方向。纳米带晶格完整,少有缺陷,而在纳米线中观察到Σ17、Σ5的[001]倾侧晶界和Σ17[001]对称倾转晶界,倾侧晶界由一晶粒的{410}或{210}晶面族与另一晶粒的{200}晶面族相互碰撞而形成;对称倾转晶界由两晶粒的{410}晶面族相互碰撞而形成。The TEM characterization of lead sulfide ultra small nanobelts and nanowires were reported. The width of nanobelts was less than 20nm, and the diameter of nanowires was about 30nm. All of them grew along[110] direction. The nanobelts were perfect and absent of defects, while Σ17,Σ5[001] tilt grain boundaries and Σ17 symmetrical[001] grain boundaries were observed in nanowires. The grain boundaries might be resulted from the collision of {410} or {210} with {410} or {200}, respectively.

关 键 词：纳米线 纳米带 TEM表征 硫化铅 超细 研究结果 生长方向 晶界 晶面 晶粒 对称 碰撞 

分 类 号：TB383[一般工业技术—材料科学与工程]