机内测试虚警分析及控制  

Built-in Test (BIT) False Alarm Analysis and Control

作　　者：徐亨成[1] 杨文杰[1] 

机构地区：[1]空军第一航空学院,河南信阳464000

出　　处：《国外电子测量技术》2005年第5期39-42,共4页Foreign Electronic Measurement Technology

摘　　要：由于现代武器系统复杂化程度不断扩大,使得检测和维修难度增大,比如测试时间变长、维修保障费用增加。为解决这些问题,现代武器系统广泛采用机内测试(BuiltinTest,简称BIT)技术,以便对其内部故障进行自动检测、诊断和隔离。但是常规BIT面临着诊断能力不足和诊断模糊性,导致BIT虚警率高,难以有效发挥其应有的作用。本文首先初步论述了BIT虚警基本理论、虚警问题影响后果、虚警问题现状;然后从BIT虚警产生原因分析入手提出了解决虚警问题的一些方法和措施,为现代武器系统测试和维修的深入研究打下基础,对BIT的广泛应用同样具有指导意义。Because the modern weapon system became more and more complexity, it will lead the fault detection and maintenance more difficult, such as the fault detecting time became long and the cost increases. In order to overcome these limitations, the Built-in Test (BIT) technology, which can detect and isolate the inter-fault, is widely used in the modern weapon system. But the normal BIT that faces the deficiency in diagnostic capability and diagnostic ambiguity will cause a high fault alarm rate, and cannot be used in the modern weapon system efficaciously. This paper first discussed the basic theory and the status of the BIT fault alarm, the affection caused by the BIT fault alarm, and the reason to cause the BIT fault alarm. Then it gave some advices and way to decrease the BIT fault alarm.

关 键 词：机内测试 现代武器系统 控制 产生原因分析 BIT 测试时间 保障费用 TEST 自动检测 内部故障 诊断能力 系统测试 复杂化 维修 模糊性 虚警率 

分 类 号：TN959.17[电子电信—信号与信息处理] V243[电子电信—信息与通信工程]