Cr/Ru/PtCo/Ru/PtCo/Ru介质中底层Ru厚度对磁记录特性影响的研究  

Effect of thickness of the Ru under layer on the magneticrecording property of Cr/Ru/PtCo/Ru/PtCo/Ru media

作　　者：张爱国[1] 王荫君[1] 韩秀峰[1] 詹文山[1] 

机构地区：[1]中国科学院物理研究所磁学国家重点实验室,北京100080

出　　处：《物理学报》2005年第4期1831-1835,共5页Acta Physica Sinica

基　　金：国家自然科学基金 (批准号 :60 1710 3 1)资助的课题~~

摘　　要：讨论了Cr Ru(1) PtCo(稳定层 ) Ru(2 ) PtCo(记录层 ) Ru(3)结构的矫顽力Hc 与层间反铁磁耦合交换场Hex随Ru(1)与Ru(2 )厚度变化的规律 .研究发现 ,样品的矫顽力及交换场随Ru(1)厚度增加而增大 ,这可能是由Ru(1)hcp结构引起的 .矫顽力及交换场在Ru(2 )厚度为 0 8nm处有峰值 .We report the effect of Ru ( seed-layer) on the interlayer antiferromagnetic coupling field H-ex, and coercivity H-c in the Cr/Ru( seed-layer)/PtCo (thermal stabilizing layer)/Ru (spacer layer) /PtCo (recording layer) /Ru (protective layer) films. Both H-ex and H-c increase with the increase of the thickness of the seed-layer Ru. It arises probably from the appearance of hep structure in the seed-layer Ru. H-ex and H-c show a peak value at Ru(seed-layer) layer with a thickness of similar to 0.8 nm.

关 键 词：矫顽力 反铁磁耦合 磁记录密度 交换场 薄膜物理学 

分 类 号：O482.4[理学—固体物理]